[1] L. F. Deng, P. T. Lai, W. B. Chen, J. P. Xu, Y. R. Liu, H. W. Choi, and C. M. Che, Effects of Different Annealing Gases on Pentacene OTFT With HfLaO Gate Dielectric. Electronic Device Letters. Vol. 32 p: 93-95, 2011. [2]陈卫兵,杨伟丰,邹豪杰,汤建新等,掺杂CuPc的MEH-PPV/PCBM有机太阳电池研究,物理学报, Vol.60, p:117107, 2011. [3] Chen Weibing, Zhang Hongbo et al, A Study of OFDM Synchronization Algorithm Based on Coaxial Cable Operating at Gigabit,2011 International Conference on Intelligent Systems Design and Engineering Applications. (ISDEA2011), p:143-147, 2011. [4] Chen Weibing, Zeng Guanghua et al, Study of A Single Neuron Fuzzy PID DC Motor Control method,2011 International Conference on Intelligent Systems Design and Engineering Applications. (ISDEA2011), p:1125-1129, 2011. [5] W. B. Chen, M. Z. Deng, H. J. Zou, C. Y. Li, L. F. Deng, P. T. Lai, Improved efficiency of organic photovoltaic MEH-PPV/PCBM device with CuPc-doping. EDSSC2010, Hongkong, 978-1-4244-9998-4. [6] L. F. Deng, P. T. Lai, W. B. Chen, J. P. Xu, Y. R. Liu, H. W. Choi, and C. M. Che, Effects of Different Annealing Gases on Pentacene OTFT With HfLaO Gate Dielectric. Electronic Device Letters. Vol. 32 p: 93-95, 2011. [7]陈卫兵,徐静平,邹豪杰,李长云, NO退火对并五苯有机薄膜晶体管特性的改善,华中科技大学学报,Vol. 38, No. 7, p: 66, 2010。 [8]Chen W. B., Xu J. P., Lai P. T., et al.Electrical characteristics of MOS capacators with HfTiON as gate dielectric. Journal of wuhan university of technology-Materials science. Vol. 24(1) p:57, 2009 (SCI) [9] W. B. Chen, H. J. Zou, M. Z. Deng, C. Y. Li and L. F. Deng, A Limiting Amplifier with LOS Indication for Gigabit Ethernet, IEEE EDSSC, 2008, 12, 8 . [10] W. B. Chen, H. F. Xiang, Z. X. Xu, B. P. Yan, V. A. L. Roy, C. M. Che*, P. T. Lai, Improving efficiency of organic photovoltaic cells with pentacene-doped CuPc layer. Applied Physics Letter. Vol. 91 p: 191109, 2007. [11] Chen W. B. , Xu J. P., Lai P. T., et al. Gate Leakage Properties of MOSFET Devices with Tri-Layer High-k Gate Dielectric. Microelectronics reliability. Vol. 47 No. 6 p: 937, 2007. [12]Chen W. B., Xu J. P., Lai P. T., et al.Electrical characteristics of MOScapacitor with HfTiON gatedielectric andHfTiSiONinterlayer. Chinese Physics. Vol. 15, No. 8, p: 1879,2006。 [13] W. B. CHEN, J. P. XU, P. T. LAI, Y. P. LI, S. G. XU. Gate leakage properties of MOS devices with tri-layer high-k gate dielectric. 2005 IEEE conference on Electron Devices and Solid-State Circuits. December 19-21, 2005. Hong Kong, P: 695. [14]陈卫兵,徐静平,邹豪杰,李长云, NO退火对并五苯有机薄膜晶体管特性的改善,华中科技大学学报,Vol. 38, No. 7, p: 66, 2010。 [15]陈卫兵,徐静平,邹晓等,小尺寸MOSFET隧穿电流解析模型,物理学报,Vol. 55, No. 10, p: 5036, 2006。 [16]陈卫兵,徐静平,李艳萍,许胜国,邹晓,不同温度退火的HfTiON栅介质MOS电容电特性研究,固体电子学研究与进展,Vol.28, 1,142-144, 2008。 [17]陈卫兵,徐静平,邹晓,李艳萍,赵寄,高k栅介质MOSFET电特性的模拟分析,固体电子学研究与进展, Vol. 24, No. 4, p: 418, 2004。 |